Please use this identifier to cite or link to this item: http://hdl.handle.net/10497/17197
Title: Crystallization of an amorphous lead zirconate titanate thin film with a dense-plasma-focus device
Authors: Rawat, Rajdeep Singh
Srivastava, M. P.
Tandon, S.
Mansingh, A.
Issue Date: 1993
Citation: Rawat, R. S., Srivastava, M. P., Tandon, S., & Mansingh, A. (1993). Crystallization of an amorphous lead zirconate titanate thin film with a dense-plasma-focus device. Physical Review B, 47(9), 4858-4864.
Abstract: The pulsed ion beam of highly energetic argon ions that is generated during the focus phase of the dense-plasma-focus (DPF) device is used to crystallize the as-grown rf-sputtered amorphous thin film of lead zirconate titanate (PZT). Many samples of PZT thin films of different thicknesses are exposed to the DPF device. The 0.9-pm-thick PZT thin film is crystallized to the desired rhombohedral phase. The scanning electron microscopy photograph of this film indicates a reasonably good surface quality.
URI: http://hdl.handle.net/10497/17197
ISSN: 1098-0121
Other Identifiers: 10.1103/PhysRevB.47.4858
Website: http://dx.doi.org/10.1103/PhysRevB.47.4858
Appears in Collections:Journal Articles

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