Publication: Magnetoimpedance of epitaxial Y3Fe5O12 (001) thin film in low-frequency regime
Date
2020
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Publisher
American Chemical Society
Abstract
The atomically flat interface of the Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (YIG) thin film and the Gd<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub> (GGG) substrate plays a vital role in obtaining the magnetization dynamics of YIG below and above the anisotropy field. Here, magnetoimpedance (MI) is used to investigate the magnetization dynamics in fully epitaxial 45 nm YIG thin films grown on the GGG (001) substrates using a copper strip coil in the MHz–GHz frequency region. The resistance (R) and reactance (X), which are components of impedance (Z), allow us to probe the absorptive and dispersive components of the dynamic permeability, whereas a conventional spectrometer only measures the field derivative of the power absorbed. The distinct excitation modes arising from the resonance in the uniform and dragged magnetization states of YIG are respectively observed above and below the anisotropy field. The magnetodynamics clearly shows the visible dichotomy between two resonant fields below and above the anisotropy field and its motion as a function of the direction of the applied magnetic field. A low value of a damping factor of ∼4.7 – 6.1 × 10<sup>–4</sup> is estimated for uniform excitation mode with an anisotropy field of 65 ± 2 Oe. Investigation of below and above anisotropy field-dependent magnetodynamics in the low-frequency mode can be useful in designing the YIG-based resonators, oscillators, filters, and magnonic devices.
Description
This is the final draft, after peer-review, of a manuscript / book chapter published in ACS Applied Materials & Interfaces. The published version is available online at https://pubs.acs.org/doi/abs/10.1021/acsami.0c13213
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Citation
Rohit Medwal, Ushnish Chaudhuri, Vas, J. V., Angshuman Deka, Surbhi Gupta, Martial, D., Hironori, A., Yasuhiro, F., Ramanathan Mahendiran, & Rawat, R. S. (2020). Magnetoimpedance of epitaxial Y3Fe5O12 (001) thin film in low-frequency regime. ACS Applied Materials & Interfaces, 12(37), 41802-41809. https://doi.org/10.1021/acsami.0c13213