Educational Research AY2017/2018
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Browsing Educational Research AY2017/2018 by Author "Paas, Fred"
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- PublicationRestrictedWorking memory resources depletion can explain why delayed testing is superior to immediate testing(2019)Yeo, Shu YuanCognitive load theory (CLT) predicts that working memory will be less taxed by presenting learning elements in an isolated format first and later integrating them for a complete understanding of the task, in comparison to presenting them integrated from the start. In addition, CLT has recently adopted the idea of working memory resource depletion, which means that working memory resources can be depleted by mental work and replenished by mental rest. In this experiment, we combined the isolated-elements and resource depletion effects to investigate the hypothesis that delayed testing would be superior to immediate testing on a math task for primary students. Results only revealed higher performance on the delayed test than on the immediate test.
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